An alternative measure of x-ray absorption spectroscopy (XAS) called inversepartial fluorescence yield (IPFY) has recently been developed that is both bulksensitive and free of saturation effects. Here we show that the angledependence of IPFY can provide a measure directly proportional to the totalx-ray absorption coefficient, $\mu(E)$. In contrast, fluorescence yield (FY)and electron yield (EY) spectra are offset and/or distorted from $\mu(E)$ by anunknown and difficult to measure amount. Moreover, our measurement candetermine $\mu(E)$ in absolute units with no free parameters by scaling to$\mu(E)$ at the non-resonant emission energy. We demonstrate this techniquewith measurements on NiO and NdGaO$_3$. Determining $\mu(E)$ across edge-stepsenables the use of XAS as a non-destructive measure of material composition. InNdGaO$_3$, we also demonstrate the utility of IPFY for insulating samples,where neither EY or FY provide reliable spectra due to sample charging andself-absorption effects, respectively.
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